Talk:PlanetPhysics/Scanning Force Microscopy SFM
Original TeX Content from PlanetPhysics Archive[edit source]
%%% This file is part of PlanetPhysics snapshot of 2011-09-01 %%% Primary Title: scanning force microscopy (SFM) %%% Primary Category Code: 00. %%% Filename: ScanningForceMicroscopySFM.tex %%% Version: 4 %%% Owner: bci1 %%% Author(s): bci1 %%% PlanetPhysics is released under the GNU Free Documentation License. %%% You should have received a file called fdl.txt along with this file. %%% If not, please write to gnu@gnu.org. \documentclass[12pt]{article} \pagestyle{empty} \setlength{\paperwidth}{8.5in} \setlength{\paperheight}{11in}
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Scanning force microscopy (SFM) or Atomic Force Microscopy (AFM) is a very high-resolution \htmladdnormallink{type}{http://planetphysics.us/encyclopedia/Bijective.html} of \htmladdnormallink{scanning probe microscopy}{http://planetphysics.us/encyclopedia/FCS3.html} that uses a very sharp scan tip probe of about 50 microns, with demonstrated resolution in the AFM images of fractions of a nanometer, or at least 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them
the Nobel Prize for Physics in 1986.
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